Structural and functional properties of the nanostructured temperature-sensitive thick films based on Cu0.1Ni0.8Co0.2Mn1.9O4 and Cu0.8Ni0.1Co0.2Mn1.9O4 ceramics

The phase composition, microstructure, and electrical properties of nanostructured thick films based on Cu 0.1 Ni 0.8 Co 0.2 Mn 1.9 O 4 and Cu 0.8 Ni 0.1 Co 0.2 Mn 1.9 O 4 ceramics were studied. Degradation tests were performed at 170 °C to stabilize the functional properties of thick films. The eff...

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Bibliographic Details
Published in:Molecular Crystals and Liquid Crystals 2023, Vol.ahead-of-print (ahead-of-print), p.1-9
Main Authors: Klym, Halyna, Hadzaman, Ivan, Kostiv, Yuriy
Format: Article
Language:English
Subjects:
Ceramics
Degradation
Electrical properties
High temperature
microstructure
Nanoelectronics
Nanostructure
Nanotechnology devices
Parameter sensitivity
Phase composition
sensor nanoelectronics
Stabilization
Thick films
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Summary:The phase composition, microstructure, and electrical properties of nanostructured thick films based on Cu 0.1 Ni 0.8 Co 0.2 Mn 1.9 O 4 and Cu 0.8 Ni 0.1 Co 0.2 Mn 1.9 O 4 ceramics were studied. Degradation tests were performed at 170 °C to stabilize the functional properties of thick films. The effect of thermal "shock" at the initial stage of isothermal exposure with subsequent stabilization of electrical resistance at this level was revealed. It is shown that high-temperature sensitivity and stabilization of electrical parameters in the studied single-phase thick films can be used for the production of thick-film sensor components for nanoelectronics devices.
ISSN:1542-1406
1563-5287
1527-1943
DOI:10.1080/15421406.2023.2225027