Effective resistance and transmittance of two-dimensional nanowire based networks: computational investigation to study the effect of filler length fraction

We have numerically calculated the effective resistance ( R eff ) and transmittance ( % T) of two-dimensional films. These transparent conductive films are considered to be composed of widthless nanowires like fillers randomly placed onto the non-conducting substrate. We have completely considered a...

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Bibliographic Details
Published in:Optical and quantum electronics 2023-05, Vol.55 (5), Article 394
Main Authors: Bharti, Yugam, Malik, Vikas, Rathee, Parshvi, Aggarwal, Shruti
Format: Article
Language:English
Subjects:
Characterization and Evaluation of Materials
Computer Communication Networks
Electrical Engineering
Fillers
Lasers
Nanowires
Optical Devices
Optics
Optoelectronics
Percolation theory
Photonics
Physics
Physics and Astronomy
Substrates
Transmittance
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Summary:We have numerically calculated the effective resistance ( R eff ) and transmittance ( % T) of two-dimensional films. These transparent conductive films are considered to be composed of widthless nanowires like fillers randomly placed onto the non-conducting substrate. We have completely considered all the fundamental and geometric aspects (constant length, random orientation) of system. The simulated model outputs the values which are clearly the result of connectivity of the components of network. The conductivity of the system is estimated using percolation theory. The effect of adding wires of longer length on optoelectronic properties of networks is probed. We have demonstrated that the highest improvement in the system’s conductivity and transmittance is 8 % for the concentration of longer wires taken into consideration when the bidisperse distribution of length, or combination of two constant lengths of nanowires, is taken into account.
ISSN:0306-8919
1572-817X
DOI:10.1007/s11082-023-04664-5