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Microstructure and Defect Characterization Using Advanced STEM Techniques: 4D-STEM and WB DF STEM

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Bibliographic Details
Published in:	Microscopy and microanalysis 2019-08, Vol.25 (S2), p.1834-1835
Main Authors:	Miao, J., Casalena, L., Ciston, J., Pekin, T., Ghazisaeidi, M., Mills, M. J.
Format:	Article
Language:	English
Subjects:	In situ TEM of Nanoscale Materials and Electronic Devices for Phase Transformation Studies Physical Science Symposia
Citations:	Items that this one cites
Online Access:	Get full text
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