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Green function study of quantum transport in ultra-small devices with embedded atomistic clusters

Transport in limiting scale MOSFET transistors will be strongly influenced by quantum effects and the presence of atomistic scattering centres either intentionally or un-intentionally present in the channel and the device environs. The scattering in such systems is non-asymptotic and the selfaveragi...

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Bibliographic Details
Published in:Journal of physics. Conference series 2006-04, Vol.35 (1), p.233-246
Main Authors: Barker, J R, Martinez, A, Svizhenko, A, Anantram, A, Asenov, A
Format: Article
Language:English
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Summary:Transport in limiting scale MOSFET transistors will be strongly influenced by quantum effects and the presence of atomistic scattering centres either intentionally or un-intentionally present in the channel and the device environs. The scattering in such systems is non-asymptotic and the selfaveraging conditions of the Kohn-Luttinger theorem fail so that a self-energy for impurity scattering does not exist. Atomistic scattering must therefore be treated non-perturbatively. Previously it has been shown that quantized micro-vortices may occur at definite energies in the current flow contributing to both the blocking effect and to effective mobility. The present study uses the Glasgow and NASA NEGF simulators to study vortex formation and tunnelling through small clusters of atomistic impurities arranged with various configurations within the 5 nm wide by 12 nm long channel of a Double Gate MOSFET. The I-V characteristics and the threshold voltage are severely affected by the distribution of the charges in the channel. A variety of different geometry atomistic clusters have been studied. Examination of the energy dependent current density allows an evaluation of the admixture of strong quantum flows such as micro-vortices to the net current. It is found that the threshold voltage and conductance are strongly dependent on the impurity configuration. The I-V characteristics are monotonic in most cases due to the strong thermal smoothing that prevents resolution of the mode structure.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/35/1/021