Investigation and optimization of the charge generation layer (CGL) in tandem OLEDs using Taguchi’s orthogonal arrays and nondestructive capacitance-voltage (C-V) measurements

In this study, we utilize a simple, reliable Taguchi’s orthogonal array to optimize a tandem organic light-emitting diode (OLED). Furthermore, we use a capacitance-voltage (C-V) measurement to verify the charge generation layer (CGL) performance and make tandem OLED performance predictions. We demon...

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Bibliographic Details
Published in:Synthetic metals 2021-04, Vol.274, p.116713, Article 116713
Main Authors: Chen, Yih-Yuan, Tsai, Chi-Ting, Huang, Wei-Lin, Chien, Cheng-Wei, Kao, Po-Ching, Chu, Sheng-Yuan
Format: Article
Language:English
Subjects:
Admittance spectroscopy
C-V measurement
Capacitance
Current efficiency
Efficiency
Electric potential
OLED
Optimization
Organic light emitting diodes
Orthogonal arrays
Taguchi method
Tandem
Voltage
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Summary:In this study, we utilize a simple, reliable Taguchi’s orthogonal array to optimize a tandem organic light-emitting diode (OLED). Furthermore, we use a capacitance-voltage (C-V) measurement to verify the charge generation layer (CGL) performance and make tandem OLED performance predictions. We demonstrate that Taguchi’s orthogonal array works correctly. In addition, it was determined that C-V measurement is a reliable way to resolve the CGL mechanisms and predict OLED efficiency directly. Based on the experimental results, it was proven that using the Taguchi’s orthogonal array improved the efficiency of the tandem OLED device. The current efficiency increased from 3.56 cd/A to 6.13 cd/A. The results of the C-V measurement were compared with the Taguchi’s orthogonal array, and the performance of the device was analyzed based on changes in the trend of the capacitance value. These two methods can be used together to achieve reliable optimization results with a limited number of experiments. •We utilize a reliable Taguchi’s orthogonal array to optimize a tandem organic light-emitting diode (OLED).•We use capacitance-voltage (C-V) measurement to verify the charge generation layer (CGL) performance.•C-V measurement can be a reliable way to resolve the CGL mechanisms and predict OLED efficiency directly.•The current efficiency increased from the 3.56 cd/A to 6.13 cd/A.
ISSN:0379-6779
1879-3290
DOI:10.1016/j.synthmet.2021.116713