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The critical role of composition-dependent intragrain planar defects in the performance of MA1–xFAxPbI3 perovskite solar cells

Perovskite solar cells show excellent power conversion efficiencies, long carrier diffusion lengths and low recombination rates. This encourages a view that intragrain defects are electronically benign with little impact on device performance. In this study we varied the methylammonium (MA)/formamid...

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Bibliographic Details
Published in:Nature energy 2021-06, Vol.6 (6), p.624-632
Main Authors: Li, Wei, Rothmann, Mathias Uller, Zhu, Ye, Chen, Weijian, Yang, Chenquan, Yuan, Yongbo, Choo, Yen Yee, Wen, Xiaoming, Cheng, Yi-Bing, Bach, Udo, Etheridge, Joanne
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Language:English
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Summary:Perovskite solar cells show excellent power conversion efficiencies, long carrier diffusion lengths and low recombination rates. This encourages a view that intragrain defects are electronically benign with little impact on device performance. In this study we varied the methylammonium (MA)/formamidinium (FA) composition in MA 1 – x FA x PbI 3 ( x  = 0–1), and compared the structure and density of the intragrain planar defects with device performance, otherwise keeping the device nominally the same. We found that charge carrier lifetime, open-circuit voltage deficit and current density–voltage hysteresis correlate empirically with the density and structure of {111} c planar defects ( x  = 0.5–1) and {112} t twin boundaries ( x  = 0–0.1). The best performance parameters were found when essentially no intragrain planar defects were evident ( x  = 0.2). Similarly, reducing the density of {111} c planar defects through MASCN vapour treatment of FAPbI 3 ( x  ≈ 1) also improved performance. These observations suggest that intragrain defect control can provide an important route for improving perovskite solar cell performance, in addition to well-established parameters such as grain boundaries and interfaces. The role of intragrain planar defects in halide perovskite solar cell devices remains elusive. Now, Li et al. tune the composition of the perovskite layer to minimize the planar defect density and observe an improvement in the device performance.
ISSN:2058-7546
2058-7546
DOI:10.1038/s41560-021-00830-9