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Synthesis and Thermoelectric Properties of ZrxTi1−xNiSn0.98Sb0.02n-Type Half-Heusler Materials

Hf-free Zr x Ti 1− x NiSn 0.98 Sb 0.02 ( x  = 0.25, 0.5, 0.75) n -type half-Heusler (HH) thermoelectric materials were synthesized by a serial processing method including induction melting (IM), annealing, ball milling, and spark plasma sintering (SPS). For comparison, a Hf-containing half-Heusler H...

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Bibliographic Details
Published in:Journal of electronic materials 2021, Vol.50 (7), p.4178-4185
Main Authors: Joo, Sung-Jae, Son, Ji-Hee, Lee, Ho Seong, Jang, Jeongin, Kim, Bong-Seo, Min, Bok-Ki
Format: Article
Language:English
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Summary:Hf-free Zr x Ti 1− x NiSn 0.98 Sb 0.02 ( x  = 0.25, 0.5, 0.75) n -type half-Heusler (HH) thermoelectric materials were synthesized by a serial processing method including induction melting (IM), annealing, ball milling, and spark plasma sintering (SPS). For comparison, a Hf-containing half-Heusler Hf 0.25 Zr 0.25 Ti 0.5 NiSn 0.98 Sb 0.02 ingot was also alloyed by arc melting, and the effects of Hf on the thermoelectric properties were estimated. The Zr x Ti 1− x NiSn 0.98 Sb 0.02 HH materials were nearly pure according to the x-ray diffraction analysis, but microscopic investigation revealed impurity phase inclusions of unalloyed Sn, Zr, and Ti. The power factor (PF) of the Hf-free HH materials reached the maximum value of 4.31 mWm −1  K −2 at 823 K in Zr 0.75 Ti 0.25 NiSn 0.98 Sb 0.02 , which was higher than Hf 0.25 Zr 0.25 Ti 0.5 NiSn 0.98 Sb 0.02 (4.01 mWm −1  K −2 at 773 K) in this study. However, the thermal conductivity of the Hf-free samples was significantly higher, by which the maximum dimensionless figure of merit was slightly lower (ZT max  = 0.92 in Zr 0.75 Ti 0.25 NiSn 0.98 Sb 0.02 at 873 K) than that of Hf 0.25 Zr 0.25 Ti 0.5 NiSn 0.98 Sb 0.02 (ZT max  = 1.03 at 873 K). The thermal conductivity was decomposed into lattice and electronic contributions, and the possible correlation with Ni off-stoichiometry is discussed.
ISSN:0361-5235
1543-186X
DOI:10.1007/s11664-021-08938-0