SWIPE Multi-mode Pixel Assembly Design and Beam Pattern Measurements at Cryogenic Temperature

In this paper, we present beam pattern tests performed on the SWIPE multi-mode bolometric detector pixel assembly. A 20-mm-aperture horn is coupled to a large detector absorber (10 mm diameter) with a TES sensor located on the side. The pixel assembly has been tested at the bolometer base temperatur...

Full description

Saved in:
Bibliographic Details
Published in:Journal of low temperature physics 2020-04, Vol.199 (1-2), p.312-319
Main Authors: Columbro, F., Madonia, P. G., Lamagna, L., Battistelli, E. S., Coppolecchia, A., de Bernardis, P., Gualtieri, R., Masi, S., Paiella, A., Piacentini, F., Presta, G., Biasotti, M., D’Alessandro, G., Gatti, F., Mele, L., Siri, B.
Format: Article
Language:English
Subjects:
Absorbers
Apertures
Assembly
Bolometers
Characterization and Evaluation of Materials
Condensed Matter Physics
Cryogenic temperature
Diameters
Low pass filters
Low temperature physics
Magnetic Materials
Magnetism
Neoprene
Physics
Physics and Astronomy
Pixels
Sensors
Vignetting
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this paper, we present beam pattern tests performed on the SWIPE multi-mode bolometric detector pixel assembly. A 20-mm-aperture horn is coupled to a large detector absorber (10 mm diameter) with a TES sensor located on the side. The pixel assembly has been tested at the bolometer base temperature of 340 mK, inside a custom cryogenic test bed, looking at a Gunn oscillator (128 GHz) located in the far field. We developed a custom cryogenic neoprene absorber, in addition to the stack of standard metal meshes low-pass filters, to reduce the background on the detector at a level similar to the one expected in flight, allowing to measure the main beam of the pixel assembly. The measured FWHM is 21 ∘ , slightly narrower than the expected one (24 ∘ ), due to vignetting produced by the filters stack.
ISSN:0022-2291
1573-7357
DOI:10.1007/s10909-020-02396-4