Aberration-Correction in a Monochromated and Energy Filtered Environment

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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Bibliographic Details
Published in:Microscopy and microanalysis 2009-07, Vol.15 (S2), p.1490-1491
Main Authors: Bell, DC, Meyer, S, Orchowski, A, Tayebati, P, Benner, G
Format: Article
Language:English
Subjects:
Physical Sciences
The Otto Scherzer Memorial Symposium on Aberration-Corrected Electron Microscopy
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
ISSN:1431-9276
1435-8115
DOI:10.1017/S143192760909864X