Simultaneous Imaging and EELS with 0.1nm and 0.35eV

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Bibliographic Details

Published in:	Microscopy and microanalysis 2004-08, Vol.10 (S02), p.846-847
Main Authors:	Bleloch, Andrew L, Falke, Uwe, Falke, Meiken
Format:	Article
Language:	English
Subjects:	Electron Energy-Loss and X-ray Absorption Spectroscopies: Focus on Anisotropic Properties
Online Access:	Get full text
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