Sub-[Angstrom]ngstrom Resolution with Aberration-Corrected TEM: Present and Future

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004. [PUBLICATION ABSTRACT]

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Bibliographic Details
Published in:Microscopy and microanalysis 2004-08, Vol.10 (S03), p.68
Main Author: O'Keefe, Michael A
Format: Article
Language:English
Subjects:
Carbon
Charged particles
Microscopy
Science
Silicon
Software
Online Access:Get full text
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Description
Summary:Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004. [PUBLICATION ABSTRACT]
ISSN:1431-9276
1435-8115