Contact mechanics modeling of pull-off measurements: Effect of solvent, probe radius, and chemical binding probability on the detection of single-bond rupture

Pull-off forces for chemically modified atomic force microscopy tips in contact with flat substances coated with receptor molecules are calculated using a Johnson, Kendall, and Roberts contact mechanics model. The expression for the work of adhesion is modified to account for the formation of discre...

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Published in:Analytical chemistry (Washington) 2002-07, Vol.74 (13), p.3096
Main Authors: Skulason, Hjalti, Frisbie, C Daniel
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Language:English
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Chemical bonds
Molecules
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Frisbie, C Daniel
description Pull-off forces for chemically modified atomic force microscopy tips in contact with flat substances coated with receptor molecules are calculated using a Johnson, Kendall, and Roberts contact mechanics model. The expression for the work of adhesion is modified to account for the formation of discrete numbers of chemical bonds between the tip and substrate.
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source American Chemical Society:Jisc Collections:American Chemical Society Read & Publish Agreement 2022-2024 (Reading list)
subjects Chemical bonds
Molecules
title Contact mechanics modeling of pull-off measurements: Effect of solvent, probe radius, and chemical binding probability on the detection of single-bond rupture
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