Contact mechanics modeling of pull-off measurements: Effect of solvent, probe radius, and chemical binding probability on the detection of single-bond rupture

Pull-off forces for chemically modified atomic force microscopy tips in contact with flat substances coated with receptor molecules are calculated using a Johnson, Kendall, and Roberts contact mechanics model. The expression for the work of adhesion is modified to account for the formation of discre...

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Bibliographic Details
Published in:Analytical chemistry (Washington) 2002-07, Vol.74 (13), p.3096
Main Authors: Skulason, Hjalti, Frisbie, C Daniel
Format: Article
Language:English
Subjects:
Chemical bonds
Molecules
Online Access:Get full text
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Summary:Pull-off forces for chemically modified atomic force microscopy tips in contact with flat substances coated with receptor molecules are calculated using a Johnson, Kendall, and Roberts contact mechanics model. The expression for the work of adhesion is modified to account for the formation of discrete numbers of chemical bonds between the tip and substrate.
ISSN:0003-2700
1520-6882