Crystallinity and ferroelectric analysis on sol-gel derived Ba0.7Er0.3TiO3 thin films

Sol-gel erbium doped barium titanate (Ba0.7Er0.3TiO3) thin films have been spun-coated on SiO2/Si and Pt/TiO2/SiO2/Si substrates, then characterized using X-ray diffractometer (XRD) and Sawyer-tower circuit to study the crystallinity and ferroelectric hysteresis loop, respectively. In XRD, lattice g...

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Bibliographic Details
Main Authors: Ooi, Zeen Vee, Saif, Ala’eddin A., Haniff, Muhammad Aniq Shazni Mohammad
Format: Conference Proceeding
Language:English
Subjects:
Barium titanates
Crystal structure
Crystallinity
Crystallization
Erbium
Ferroelectric materials
Ferroelectricity
Film thickness
Hysteresis loops
Lattice parameters
Perovskite structure
Perovskites
Silicon dioxide
Silicon substrates
Sol-gel processes
Thin films
Titanium dioxide
X-ray diffraction
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Summary:Sol-gel erbium doped barium titanate (Ba0.7Er0.3TiO3) thin films have been spun-coated on SiO2/Si and Pt/TiO2/SiO2/Si substrates, then characterized using X-ray diffractometer (XRD) and Sawyer-tower circuit to study the crystallinity and ferroelectric hysteresis loop, respectively. In XRD, lattice geometric equations have been applied to expose the lattice parameters for Ba0.7Er0.3TiO3 thin film, which show that the films hold tetragonal perovskite structure at room temperature. In addition, size-strain plot has been employed to the scanned patterns, which reveals that the films are nano-crystallized. The results obtained via sawyer-tower circuit confirm the ferroelectricity nature within the Ba0.7Er0.3TiO3 thin films, and the remnant polarization increase with increasing of film thickness.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.4981827