Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)

Talbot-Lau X-ray deflectometry (TXD) has been developed as an electron density diagnostic for High Energy Density (HED) plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was d...

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Bibliographic Details
Published in:Review of scientific instruments 2016-11, Vol.87 (11), p.11D501-11D501
Main Authors: Valdivia, M. P., Stutman, D., Stoeckl, C., Mileham, C., Begishev, I. A., Theobald, W., Bromage, J., Regan, S. P., Klein, S. R., Muñoz-Cordovez, G., Vescovi, M., Valenzuela-Villaseca, V., Veloso, F.
Format: Article
Language:English
Subjects:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
ATTENUATION
COPPER
Diagnostic systems
ELECTRON DENSITY
ELECTRONS
ENERGY DENSITY
Flux density
FOILS
GRATINGS
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
INTERFEROMETERS
KEV RANGE 01-10
LASERS
Plasma
PLASMA DENSITY
Plasmas (physics)
PULSES
REFRACTION
Scientific apparatus & instruments
Survival
X RADIATION
X ray refraction
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Summary:Talbot-Lau X-ray deflectometry (TXD) has been developed as an electron density diagnostic for High Energy Density (HED) plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping were demonstrated for 25–29 J, 8–30 ps laser pulses using copper foil targets. Moiré pattern formation and grating survival were also observed using a copper x-pinch driven at 400 kA, ∼1 kA/ns. These results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.4959158