High-Resolution Quantification Across Vertical Interfaces using a Monte Carlo Based Reconstruction Approach

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Bibliographic Details
Published in:Microscopy and microanalysis 2013-08, Vol.19 (S2), p.1296-1297
Main Authors: Richter, S., Pinard, P.T., Mevemkamp, N., Torrilhon, M.
Format: Article
Language:English
Subjects:
A16.P1 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?
Instrumentation Sciences
Interfaces
Microscopy
Monte Carlo simulation
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Description
Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927613008477