Structural and magnetic properties of polycrystalline La2NiMnO6 thin films

Polycrystalline thin films of La2NiMnO6 (LNMO) are deposited successfully on SiO2/Si substrates using pulsed laser deposition technique. Structural characterization using X-ray diffraction confirms the formation of a single phase with P2 1/n space group. Cross-sectional FE-SEM shows the film thickne...

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Bibliographic Details
Main Authors: Suresh, Pittala, Laxmi, K. Vijaya, Bhat, Shwetha G., Kumar, P. S. Anil
Format: Conference Proceeding
Language:English
Subjects:
Crystallization
Ferromagnetism
Film thickness
Magnetic properties
Magnetic transitions
Polycrystals
Pulsed laser deposition
Pulsed lasers
Silicon dioxide
Silicon substrates
Structural analysis
Thin films
Transition temperature
X-ray diffraction
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Summary:Polycrystalline thin films of La2NiMnO6 (LNMO) are deposited successfully on SiO2/Si substrates using pulsed laser deposition technique. Structural characterization using X-ray diffraction confirms the formation of a single phase with P2 1/n space group. Cross-sectional FE-SEM shows the film thickness ∼195 nm. The deposition temperature and the oxygen pressure played a crucial role determining the crystallization behavior and the magnetic transition temperatures. The ferromagnetic transition temperature is achieved to be ∼277 K by optimizing the deposition conditions.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.4990159