Self-assembled stoichiometric barium titanate thin films grown by molecular beam epitaxy

•Excess barium self-limits the stoichiometry of barium titanate.•Barium titanate self-assembles when grown using co-deposition with excess barium.•Higher piezoelectric coefficients of barium after surface cleaning. The growth of stoichiometric barium titanate using molecular beam epitaxy was investi...

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Bibliographic Details
Published in:Journal of crystal growth 2018-07, Vol.493, p.15-19
Main Authors: Morgan, T. Al, Zamani-Alavijeh, M., Erickson, S., Story, G., Schroeder, W., Kuchuk, A., Benamara, M., Salamo, G.J.
Format: Article
Language:English
Subjects:
A1 Piezoforce microscopy
A1 X-ray photoelectron spectroscopy
A3 Molecular beam epitaxy
B1 Perovskites
B2 Ferroelectrics
Barium oxides
Barium titanates
Epitaxial growth
Ferroelectric materials
Ferroelectricity
Ferroelectrics
Microscopy
Molecular beam epitaxy
Molecular beams
Perovskite
Self-assembly
Stoichiometry
Thin films
Titanium
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Summary:•Excess barium self-limits the stoichiometry of barium titanate.•Barium titanate self-assembles when grown using co-deposition with excess barium.•Higher piezoelectric coefficients of barium after surface cleaning. The growth of stoichiometric barium titanate using molecular beam epitaxy was investigated by providing excess barium during co-deposition of barium, titanium, and oxygen. X-ray photoelectron spectroscopy confirmed that excess barium accumulated at the surface as barium oxide, and that post methanol cleaning removed the barium oxide and resulted in the stoichiometry of all grown films to be that of bulk stoichiometric barium titanate. Piezoforce microscopy was used to determine the ferroelectric properties of the thin films. Results demonstrated the d33 values were equal to or better than bulk values. These results indicate that the excess barium self-limited the growth to the stoichiometry of barium titanate by transferring the excess barium to the surface as barium oxide, creating a new growth approach for barium titanate.
ISSN:0022-0248
1873-5002
DOI:10.1016/j.jcrysgro.2018.04.023