An alternative scheme to measure single-point hysteresis loops using piezoresponse force microscopy

[Display omitted] •We present a simple and low cost procedure to obtain the electromechanical response of ferroelectric materials.•Phase switching and amplitude butterfly loops are acquired from the standard AFM images.•The implementation of this procedure gives the local hysteresis loops of ferroel...

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Bibliographic Details
Published in:Measurement : journal of the International Measurement Confederation 2017-10, Vol.108, p.143-151
Main Authors: Flores-Ruiz, F.J., Gervacio-Arciniega, J.J., Murillo-Bracamontes, E., Cruz, M.P., Yáñez-Limón, J.M., Siqueiros, J.M.
Format: Article
Language:English
Subjects:
Amplitudes
Atomic force microscopes
Atomic force microscopy
Circuit diagrams
Circuits
Data acquisition
Electric potential
Electromechanical response
Electronic circuits
Ferroelectrics
Hysteresis loops
Image acquisition
Lock in amplifiers
Measurement
Microelectromechanical systems
PFM
Voltage pulses
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Summary:[Display omitted] •We present a simple and low cost procedure to obtain the electromechanical response of ferroelectric materials.•Phase switching and amplitude butterfly loops are acquired from the standard AFM images.•The implementation of this procedure gives the local hysteresis loops of ferroelectric materials.•Proposed approach is verified on a ferroelectric sol-gel PZT film. We present a simple and low cost procedure to obtain the electromechanical response, in a single-point, of non-conductive materials. The technique makes use of amplitude modulated voltage pulses in an atomic force microscope with standard configuration. Material response obtained, as signals of amplitude and phase from a lock-in amplifier as well as the input signal introduced to the conductive tip are stored in the AFM images, which act like a data acquisition system. The acquired data are processed with a free-program that eliminates the necessity of voltage pulses with constant time-widths, enabling the system to study the domain stability in piezo- and ferro-electric materials. We provide the electronic circuit diagram, flowcharts, and a free software for the implementation and execution of this procedure. Our goal is to provide an alternative scheme to measure the strain-hysteretic behavior of nonconductive materials without the need to invest in expensive software or AFM-moduli.
ISSN:0263-2241
1873-412X
DOI:10.1016/j.measurement.2017.05.046