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High Speed TEM Sample Preparation by Xe FIB

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Bibliographic Details
Published in:	Microscopy and microanalysis 2014-08, Vol.20 (S3), p.298-299
Main Authors:	Delobbe, A., Salord, O., Hrncir, T., David, A., Sudraud, P., Lopour, F.
Format:	Article
Language:	English
Subjects:	15 Years of Focused Ion Beams at M & M Advances in Instrumentation Symposia
Citations:	Items that this one cites Items that cite this one
Online Access:	Get full text
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