Analytical Study of Degradation of CIC Conductor Performance Due to Strand Bending and Buckling

Critical current of cable-in-conduit conductors for ITER TF coils was measured using a pair of short cable-in-conduit conductors, which are electrically connected from each other at the bottom joint. It was found from these test results that the measured critical current was lower than that evaluate...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2013-06, Vol.23 (3), p.6001505-6001505
Main Authors: Kajitani, H., Hemmi, T., Murakami, H., Koizumi, N.
Format: Article
Language:English
Subjects:
Applied sciences
Cable shielding
Cable-in-conduit conductors (CICC)
Conductors
Critical current
current distribution
current transfer
Degradation
Electric connection. Cables. Wiring
Electrical engineering. Electrical power engineering
Electrical power engineering
Electronics
Exact sciences and technology
Force
Imaging devices
Miscellaneous
Power cables
Power networks and lines
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Strain
Studies
Various equipment and components
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Summary:Critical current of cable-in-conduit conductors for ITER TF coils was measured using a pair of short cable-in-conduit conductors, which are electrically connected from each other at the bottom joint. It was found from these test results that the measured critical current was lower than that evaluated from the critical current performance of a single strand. One of the explanations for this phenomenon is a nonuniform current distribution due to local degradation caused by strand buckling. To study the influence on the conductor performance, the author developed a new analysis model for the calculation of bending strain due to buckling and then, combined this with the electrical circuit model, which consists of lumped and distributed circuits for the conductor and upper/bottom joints, respectively. Simulation results show that when local degradation exists, nonuniform current distribution is established. This indicated that conductor performance can be degraded by local degradation such as strand buckling.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2013.2247652