Non-magnetic substrates for low cost YBCO coated conductors

CuNiAl and NiCr alloys were made and processed to non-magnetic, bi-axially textured substrates. Epitaxial YSZ and YBCO were deposited by pulsed laser deposition on the CuNiAl. Samples were cross sectioned and investigated with TEM. It appears that Al forms a thin oxide layer at the CuNiAl surface th...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2001-03, Vol.11 (1), p.3329-3332
Main Authors: Thieme, C.L.H., Annavarapu, S., Zhang, W., Prunier, V., Fritzemeier, L., Li, Q., Schoop, U., Rupich, M.W., Gopal, M., Foltyn, S.R., Holesinger, T.
Format: Article
Language:English
Subjects:
Alloys
Aluminum
Applied sciences
COATINGS
Conductors
COPPER OXIDE
Costs
Critical current
CURRENT DENSITY
DENSITY
DEPOSITION
ELECTRICAL CONDUCTORS
Electrical engineering. Electrical power engineering
Exact sciences and technology
INTERMETALLIC COMPOUNDS
Materials
Optical pulses
Pulsed laser deposition
Radio frequency
Sputtering
Substrates
SUPERCONDUCTORS
TRANSMISSION ELECTRON MICROSCOPY
Trifluoroacetates
YBCO superconductors
Yttria stabilized zirconia
Yttrium barium copper oxide
YTTRIUM OXIDE
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Summary:CuNiAl and NiCr alloys were made and processed to non-magnetic, bi-axially textured substrates. Epitaxial YSZ and YBCO were deposited by pulsed laser deposition on the CuNiAl. Samples were cross sectioned and investigated with TEM. It appears that Al forms a thin oxide layer at the CuNiAl surface that acts as a template for the subsequent YSZ layer. The 1.2 /spl mu/m YBCO layer had a current density of 0.16 MA/cm/sup 2/ at 75 K and self field. On the NiCr substrates an Y/sub 2/O/sub 3/ seed layer was deposited with E-beam evaporation, followed by RF sputter deposition of YSZ and a CeO/sub 2/ cap layer. These substrates were coated with a 0.4 /spl mu/m YBCO layer using a trifluoroacetate solution, a very cost effective metal-organic deposition process. These samples carried critical currents exceeding 0.7 MA/cm/sup 2/ at 77 K, self field.
ISSN:1051-8223
1558-2515
DOI:10.1109/77.919775