Characterization of polysilicon bipolar transistors by low-frequency noise and correlation noise measurements

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Bibliographic Details
Published in:Semiconductor science and technology 2001-04, Vol.16 (4), p.233-238
Main Authors: Mourier, Y, G-Jarrix, S, Delseny, C, Pascal, F, Pénarier, A, Gasquet, D
Format: Article
Language:English
Subjects:
Applied sciences
Electronics
Engineering Sciences
Exact sciences and technology
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Testing, measurement, noise and reliability
Transistors
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ISSN:0268-1242
1361-6641
DOI:10.1088/0268-1242/16/4/308