Extreme-Value Statistics and Poisson Area Scaling With a Fatal-Area Ratio for Low-κ Dielectric TDDB Modeling

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Bibliographic Details
Published in:IEEE transactions on electron devices 2011, Vol.58 (9), p.3089-3098
Main Authors: FEN CHEN, SHINOSKY, Michael A, AITKEN, John M
Format: Article
Language:English
Subjects:
Applied sciences
Design. Technologies. Operation analysis. Testing
Electronics
Exact sciences and technology
Integrated circuits
Microelectronic fabrication (materials and surfaces technology)
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Testing, measurement, noise and reliability
Online Access:Get full text
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ISSN:0018-9383
1557-9646