Domain ordering of strained 5 ML SrTiO3 films on Si(001)

High resolution x-ray diffraction data indicate ordered square shaped coherent domains, ∼1200Å in length, coexisting with longer, ∼9500Å correlated regions in highly strained 5 ML SrTiO3 films grown on Si(001). These long range film structures are due to the Si substrate terraces defined by the surf...

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Bibliographic Details
Published in:Applied physics letters 2007-05, Vol.90 (22)
Main Authors: Ryan, P., Wermeille, D., Kim, J. W., Woicik, J. C., Hellberg, C. S., Li, H.
Format: Article
Language:English
Subjects:
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
ORDER PARAMETERS
SILICON
STRONTIUM OXIDES
SUBSTRATES
TITANIUM OXIDES
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Summary:High resolution x-ray diffraction data indicate ordered square shaped coherent domains, ∼1200Å in length, coexisting with longer, ∼9500Å correlated regions in highly strained 5 ML SrTiO3 films grown on Si(001). These long range film structures are due to the Si substrate terraces defined by the surface step morphology. The silicon surface “step pattern” is comprised of an “intrinsic” terrace length from strain relaxation and a longer “extrinsic” interstep distance due to the surface miscut.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2744478