Preparation of ultrathin Bi-Sr-Ca-Cu-O superconducting films by metalorganic chemical vapor deposition

Ultrathin Bi-Sr-Ca-Cu-O films close to a single unit cell [c=3.1 nm for Bi2Sr2CaCu2Ox (2212) phase] were grown on a (100)MgO substrate by metalorganic chemical vapor deposition. The ultrathin film, having an average thickness of 3.5 nm, exhibited a zero-resistance superconducting transition, Tc,0=64...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 1991-03, Vol.58 (10), p.1103-1105
Main Authors: SUGIMOTO, T, YOSHIDA, M, SUGAWA, K, SHIOHARA, Y, TANAKA, S
Format: Article
Language:English
Subjects:
360202 - Ceramics, Cermets, & Refractories- Structure & Phase Studies
360204 - Ceramics, Cermets, & Refractories- Physical Properties
ALKALINE EARTH METAL COMPOUNDS
BISMUTH COMPOUNDS
BISMUTH OXIDES
CALCIUM COMPOUNDS
CALCIUM OXIDES
CHALCOGENIDES
CHEMICAL COATING
CHEMICAL VAPOR DEPOSITION
COHERENT SCATTERING
COPPER COMPOUNDS
COPPER OXIDES
Cross-disciplinary physics: materials science
rheology
DEPOSITION
DIFFRACTION
ELECTRIC CONDUCTIVITY
ELECTRICAL PROPERTIES
ELECTRON MICROSCOPY
Exact sciences and technology
HIGH-TC SUPERCONDUCTORS
MATERIALS SCIENCE
Methods of crystal growth
physics of crystal growth
MICROSCOPY
OXIDES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
Physics
SCANNING ELECTRON MICROSCOPY
SCATTERING
STRONTIUM COMPOUNDS
STRONTIUM OXIDES
SUPERCONDUCTING FILMS
SUPERCONDUCTIVITY
SUPERCONDUCTORS
SURFACE COATING
THERMODYNAMIC PROPERTIES
TRANSITION ELEMENT COMPOUNDS
TRANSITION TEMPERATURE
X-RAY DIFFRACTION
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Ultrathin Bi-Sr-Ca-Cu-O films close to a single unit cell [c=3.1 nm for Bi2Sr2CaCu2Ox (2212) phase] were grown on a (100)MgO substrate by metalorganic chemical vapor deposition. The ultrathin film, having an average thickness of 3.5 nm, exhibited a zero-resistance superconducting transition, Tc,0=64 K, comparable with the Tc,0 of much thicker films, whereas the superconducting property of thinner films than 3.5 nm was drastically deteriorated. The x-ray diffraction (XRD) measurement of the ultrathin films showed that the reflection peaks from 00l contributed to a 2212 phase were observed even in the 2.2-nm-thick film, and that its c-axis lattice constant was consistent with that of a bulk 2212 phase. On the other hand, the thicker films than 5.5 nm mainly consisted of the Bi2Sr2Ca2Cu3Ox (2223) phase with a trace amount of the 2212 phase from the XRD patterns.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.104385