Electro-optical measurements of picosecond bunch length of a 45 MeV electron beam

We have measured the temporal duration of 45 MeV picosecond electron beam bunches using a noninvasive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with distance from the electron beam. The rise time...

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Bibliographic Details
Published in:Journal of applied physics 2001-05, Vol.89 (9), p.4921-4926
Main Authors: Tsang, T., Castillo, V., Larsen, R., Lazarus, D. M., Nikas, D., Ozben, C., Semertzidis, Y. K., Srinivasan-Rao, T., Kowalski, L.
Format: Article
Language:English
Subjects:
AMPLITUDES
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
DECAY
DETECTION
ELECTRON BEAMS
ELECTRONS
IONIZATION
MODULATION
PARTICLE BEAMS
PHYSICS
PULSE RISE TIME
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Summary:We have measured the temporal duration of 45 MeV picosecond electron beam bunches using a noninvasive electro-optical (EO) technique. The amplitude of the EO modulation was found to increase linearly with electron beam charge and decrease inversely with distance from the electron beam. The rise time of the temporal signal was limited by our detection system to ∼70 ps. The EO signal due to ionization caused by the electrons traversing the EO crystal was also observed. It has a distinctively long decay time constant and signal polarity opposite to that due to the field induced by the electron beam. The electro-optical technique may be ideal for the measurement of bunch length of femtosecond, relativistic, high energy, charged, particle beams.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.1358322