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Progress toward a microsecond duration, repetitive, intense-ion beam accelerator
Summary form only given. A number of intense ion beam applications are emerging requiring repetitive high-average-power beams. These applications include ablative deposition of thin films, rapid melt and resolidification for surface property enhancement, advanced diagnostic neutral beams for the nex...
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Main Authors: | , , , , , |
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Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
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Summary: | Summary form only given. A number of intense ion beam applications are emerging requiring repetitive high-average-power beams. These applications include ablative deposition of thin films, rapid melt and resolidification for surface property enhancement, advanced diagnostic neutral beams for the next generation of Tokamaks, and intense pulsed-neutron sources. We are developing a 250 keV, 15 kA, 1/spl mu/s duration, 1-30 Hz intense-ion beam accelerator called CHAMP (continuous high average-power microsecond pulser). The accelerator will use a magnetically insulated extraction diode in ballistically focused geometry. |
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ISSN: | 0730-9244 2576-7208 |
DOI: | 10.1109/PLASMA.1997.604800 |