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Faster radial strain relaxation in InAs-GaAs core-shell heterowires
The structure of wurtzite and zinc blende InAs-GaAs (001) core-shell nanowires grown by molecular beam epitaxy on GaAs (001) substrates has been investigated by transmission electron microscopy. Heterowires with InAs core radii exceeding 11 nm, strain relax through the generation of misfit dislocati...
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Published in: | Journal of applied physics 2012-02, Vol.111 (4), p.044301-044301-9 |
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container_title | Journal of applied physics |
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creator | Kavanagh, Karen L. Saveliev, Igor Blumin, Marina Swadener, Greg Ruda, Harry E. |
description | The structure of wurtzite and zinc blende InAs-GaAs (001) core-shell nanowires grown by molecular beam epitaxy on GaAs (001) substrates has been investigated by transmission electron microscopy. Heterowires with InAs core radii exceeding 11 nm, strain relax through the generation of misfit dislocations, given a GaAs shell thickness greater than 2.5 nm. Strain relaxation is larger in radial directions than axial, particularly for shell thicknesses greater than 5.0 nm, consistent with molecular statics calculations that predict a large shear stress concentration at each interface corner. |
doi_str_mv | 10.1063/1.3684964 |
format | article |
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Heterowires with InAs core radii exceeding 11 nm, strain relax through the generation of misfit dislocations, given a GaAs shell thickness greater than 2.5 nm. 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subjects | CUBIC LATTICES DISLOCATIONS GALLIUM ARSENIDES INDIUM ARSENIDES INTERFACES MATERIALS SCIENCE MOLECULAR BEAM EPITAXY QUANTUM WIRES RELAXATION SEMICONDUCTOR MATERIALS SHEAR STRAINS STRESSES SUBSTRATES TRANSMISSION ELECTRON MICROSCOPY |
title | Faster radial strain relaxation in InAs-GaAs core-shell heterowires |
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