Submicrometer Single Crystal Diffractometry for Highly Accurate Structure Determination

Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer syst...

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Bibliographic Details
Main Authors: Yasuda, Nobuhiro, Fukuyama, Yoshimitsu, Kimura, Shigeru, Japan Science and Technology Agency, CREST, 5, Sanbancho, Chiyoda, Tokyo 102-0075, Toriumi, Koshiro, University of Hyogo, 3-2-1 Kouto, Kamigori, Ako, Hyogo 678-1297, Takata, Masaki, RIKEN SPring-8 Center, Harima Institute, 1-1-1 Kouto, Sayo, Sayo, Hyogo 679-5148
Format: Conference Proceeding
Language:English
Subjects:
ABSORPTION
ACCURACY
ALKALINE EARTH METAL COMPOUNDS
AZINES
BARIUM COMPOUNDS
BREMSSTRAHLUNG
CORRECTIONS
CRYSTALS
CYTIDINE
DIFFRACTOMETERS
DIMENSIONLESS NUMBERS
ELECTROMAGNETIC RADIATION
ELEMENTS
GONIOMETERS
HETEROCYCLIC COMPOUNDS
INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
IONIZING RADIATIONS
MEASURING INSTRUMENTS
MONOCRYSTALS
NUCLEOSIDES
NUCLEOTIDES
OPTICS
ORGANIC COMPOUNDS
ORGANIC NITROGEN COMPOUNDS
OXYGEN COMPOUNDS
PLATES
PYRIMIDINES
RADIATION SOURCES
RADIATIONS
RIBOSIDES
SEMIMETALS
SILICON
SORPTION
SPRING-8 STORAGE RING
STORAGE RINGS
STRUCTURE FACTORS
SYNCHROTRON RADIATION
SYNCHROTRON RADIATION SOURCES
TITANATES
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
X RADIATION
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Description
Summary:Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer system. We demonstrated the structure analyses with 2x2x2 {mu}m{sup 3} cytidine, 600x600x300 nm{sup 3} BaTiO{sub 3}, and 1x1x1 {mu}m{sup 3} silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendelloesung method and do not require absorption and extinction corrections.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.3463161