Loading…

Handheld Flyback driven coaxial dielectric barrier discharge: Development and characterization

The development of a handheld single and triple chamber atmospheric pressure coaxial dielectric barrier discharge driven by Flyback circuitry for helium and argon discharges is described. The Flyback uses external metal-oxide-semiconductor field-effect transistor power switching technology and the t...

Full description

Saved in:
Bibliographic Details
Published in:Review of scientific instruments 2008-09, Vol.79 (9), p.094707-094707-10
Main Authors: Law, V. J., Milosavljević, V., O'Connor, N., Lalor, J. F., Daniels, S.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The development of a handheld single and triple chamber atmospheric pressure coaxial dielectric barrier discharge driven by Flyback circuitry for helium and argon discharges is described. The Flyback uses external metal-oxide-semiconductor field-effect transistor power switching technology and the transformer operates in the continuous current mode to convert a continuous dc power of 10-33 W to generate a 1.2-1.6 kV 3.5   μ s pulse. An argon discharge breakdown voltage of ∼ 768   V is measured. With a 50 kHz, pulse repetition rate and an argon flow rate of 0.5-10 argon slm (slm denotes standard liters per minute), the electrical power density deposited in the volume discharge increases linearly at a rate of 75 ± 20 %   mW / cm 3 per 1 slm of gas. Electrical power transfer efficiency between the secondary Flyback coil and the discharge volume increases from 0.1% to 0.65%. Neutral argon gas forced convection analysis yields a similar energy loss rate to the electrical discharge process. Optical emission spectroscopy studies of the expanding discharge plume into ambient air reveal that the air climatically controls the plume chemistry to produce an abundance of neutral argon atoms and molecular nitrogen.
ISSN:0034-6748
1089-7623
DOI:10.1063/1.2988833