Single-shot characterization of independent femtosecond extreme ultraviolet free electron and infrared laser pulses

Two-color above threshold ionization of helium and xenon has been used to analyze the synchronization between individual pulses of the femtosecond extreme ultraviolet (XUV) free electron laser in Hamburg and an independent intense 120 fs mode-locked Ti:sapphire laser. Characteristic sidebands appear...

Full description

Saved in:
Bibliographic Details
Published in:Applied physics letters 2007-03, Vol.90 (13), p.131108-131108-3
Main Authors: Radcliffe, P., Düsterer, S., Azima, A., Redlin, H., Feldhaus, J., Dardis, J., Kavanagh, K., Luna, H., Gutierrez, J. Pedregosa, Yeates, P., Kennedy, E. T., Costello, J. T., Delserieys, A., Lewis, C. L. S., Taïeb, R., Maquet, A., Cubaynes, D., Meyer, M.
Format: Article
Language:English
Subjects:
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
CORRELATIONS
Education
EXTREME ULTRAVIOLET RADIATION
FREE ELECTRON LASERS
HELIUM
Humanities and Social Sciences
MODE LOCKING
MULTI-PHOTON PROCESSES
PHOTOELECTRON SPECTROSCOPY
PHOTOIONIZATION
Physics
Physics Education
PULSES
SAPPHIRE
SYNCHRONIZATION
XENON
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Two-color above threshold ionization of helium and xenon has been used to analyze the synchronization between individual pulses of the femtosecond extreme ultraviolet (XUV) free electron laser in Hamburg and an independent intense 120 fs mode-locked Ti:sapphire laser. Characteristic sidebands appear in the photoelectron spectra when the two pulses overlap spatially and temporally. The cross-correlation curve points to a 250 fs rms jitter between the two sources at the experiment. A more precise determination of the temporal fluctuation between the XUV and infrared pulses is obtained through the analysis of the single-shot sideband intensities.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.2716360