Information storage materials: nanoscale characterisation by three-dimensional atom probe analysis

The development of nanoscale magnetic materials for applications in information storage systems relies heavily on the ability to engineer the properties of the layered structures from which such materials are fabricated. These properties are strongly dependent on the nature of the interfaces between...

Full description

Saved in:
Bibliographic Details
Published in:Acta materialia 2004-06, Vol.52 (10), p.2847-2862
Main Authors: Larson, D.J., Petford-Long, A.K., Ma, Y.Q, Cerezo, A.
Format: Article
Language:English
Subjects:
Atom probe
CHEMISTRY
COBALT
COBALT ALLOYS
Condensed matter: electronic structure, electrical, magnetic, and optical properties
COPPER
Exact sciences and technology
INTERFACES
Interfacial magnetic properties (multilayers, magnetic quantum wells, superlattices, magnetic heterostructures)
IRON ALLOYS
Layered structures
LAYERS
MAGNETIC MATERIALS
Magnetic properties and materials
Magnetic properties of surface, thin films and multilayers
Magnetic recording materials
Magnetic thin films
MATERIALS SCIENCE
NANOSTRUCTURES
PALLADIUM
Physics
PROBES
Studies of specific magnetic materials
THIN FILMS
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The development of nanoscale magnetic materials for applications in information storage systems relies heavily on the ability to engineer the properties of the layered structures from which such materials are fabricated. These properties are strongly dependent on the nature of the interfaces between the individual nanoscale magnetic layers, so knowledge of the interface chemistry is crucial. In this paper, we discuss the application of three-dimensional atom probe analysis to the characterisation of layered magnetic materials, including details of specimen preparation techniques required for this type of analysis. Recent results are presented on the characterisation of interfaces in Co/Cu or CoFe/Cu multilayers, which form part of the read sensor in magnetic recording heads, and Co/Pd multilayers, which are being considered for use as perpendicular recording media.
ISSN:1359-6454
1873-2453
DOI:10.1016/j.actamat.2004.03.015