Application of an atomic force microscope piezocantilever for dilatometry under extreme conditions

We report on the development of a sensitive dilatometer based upon an atomic force microscope piezocantilever. This dilatometer is designed to measure the elastic properties of bulk materials in extreme conditions, such as temperatures down to 25 mK and magnetic fields up to 16 T. The layered heavy...

Full description

Saved in:
Bibliographic Details
Published in:Measurement science & technology 2017-04, Vol.28 (6), p.65006
Main Authors: Wang, Liran, Schmiedeshoff, George M, Graf, David E, Park, Ju-Hyun, Murphy, Timothy P, Tozer, Stanley W, Palm, Eric, Sarrao, John L, Cooley, Jason C
Format: Article
Language:English
Subjects:
AFM piezocantilever
dilatometry
extreme condition
heavy fermion superconductor
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We report on the development of a sensitive dilatometer based upon an atomic force microscope piezocantilever. This dilatometer is designed to measure the elastic properties of bulk materials in extreme conditions, such as temperatures down to 25 mK and magnetic fields up to 16 T. The layered heavy fermion superconductor CeCoIn5 and its non-magnetic analog LaRhIn5 are measured to demonstrate their use in detecting phase transitions and quantum oscillations. In addition, using this dilatometer, a simultaneous multi-axis dilation measurement is performed. This compact dilatometer has many advantages, such as its ability to measure very small samples with sub-mm lengths at low temperature and small field dependence, and its ability to rotate, while it works well irrespective of whether it is in a changing liquid or gas environment (i.e. within a flow cryostat or mixing chamber).
ISSN:0957-0233
1361-6501
DOI:10.1088/1361-6501/aa62e2