Loading…

Evaluation of a commercially available passively Q-switched Nd:YAG laser with LiF:F2- saturable absorber for laser-induced breakdown spectroscopy

Interest in passively Q-switched microchip lasers as a means for miniaturization of laser-induced breakdown spectroscopy (LIBS) apparatus has rapidly grown in the last years. To explore the possibility of using a comparatively UV–vis transparent absorber, we herein present the first report on the ev...

Full description

Saved in:
Bibliographic Details
Published in:Optics and laser technology 2016-05, Vol.79, p.146-152
Main Authors: Carson, Cantwell G., Goueguel, Christian L., Sanghapi, Hervé, Jain, Jinesh, McIntyre, Dustin
Format: Article
Language:English
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Interest in passively Q-switched microchip lasers as a means for miniaturization of laser-induced breakdown spectroscopy (LIBS) apparatus has rapidly grown in the last years. To explore the possibility of using a comparatively UV–vis transparent absorber, we herein present the first report on the evaluation of a commercially available flash lamp-pumped passively Q-switched Nd:YAG laser with LiF:F2- saturable absorber as an excitation source in LIBS. Quantitative measurements of barium, strontium, rubidium and lithium in granite, rhyolite, basalt and syenite whole-rock glass samples were performed. Using a gated intensified benchtop spectrometer, limits of detection of 0.97, 23, 37, and 144ppm were obtained for Li, Sr, Rb, and Ba, respectively. Finally, we discuss the advantages of using such a laser unit for LIBS applications in terms of ablation efficiency, analytical performances, output energy, and standoff capabilities. •A Nd:YAG LiF:F2--switched laser was used for LIBS quantification on solid samples.•Calibrations for Li, Sr, Rb, and Ba were made from six geologic reference materials.•A background detection method enabled comparisons between matrix mis-matched samples.
ISSN:0030-3992
1879-2545
DOI:10.1016/j.optlastec.2015.12.004