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PVT Compensation for Wilkinson Single-Slope Measurement Systems

A pulse-width locked loop (PWLL) circuit is reported that compensates for process, voltage, and temperature (PVT) variations of a linear ramp generator within a 12-bit multi-channel Wilkinson (single-slope integrating) Analog-to-Digital converter (ADC). This PWLL was designed and fabricated in a 0.5...

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Published in:IEEE transactions on nuclear science 2012-10, Vol.59 (5), p.2444-2450
Main Authors: Tham, K. V., Ulaganathan, C., Nambiar, N., Greenwell, R. L., Britton, C. L., Ericson, M. N., Holleman, J., Blalock, B. J.
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cited_by cdi_FETCH-LOGICAL-c290t-9ccd3cfdb275466e73b660e242af7ff1c3489ddb8f55034bfa8de9e2406f9ea03
cites cdi_FETCH-LOGICAL-c290t-9ccd3cfdb275466e73b660e242af7ff1c3489ddb8f55034bfa8de9e2406f9ea03
container_end_page 2450
container_issue 5
container_start_page 2444
container_title IEEE transactions on nuclear science
container_volume 59
creator Tham, K. V.
Ulaganathan, C.
Nambiar, N.
Greenwell, R. L.
Britton, C. L.
Ericson, M. N.
Holleman, J.
Blalock, B. J.
description A pulse-width locked loop (PWLL) circuit is reported that compensates for process, voltage, and temperature (PVT) variations of a linear ramp generator within a 12-bit multi-channel Wilkinson (single-slope integrating) Analog-to-Digital converter (ADC). This PWLL was designed and fabricated in a 0.5- μm Silicon Germanium (SiGe) BiCMOS process. Simulation and silicon measurement data are shown that demonstrate a large improvement in the accuracy of the PVT-compensated ADC over the uncompensated ADC.
doi_str_mv 10.1109/TNS.2012.2212722
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fullrecord <record><control><sourceid>crossref_osti_</sourceid><recordid>TN_cdi_osti_scitechconnect_1079300</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>6307900</ieee_id><sourcerecordid>10_1109_TNS_2012_2212722</sourcerecordid><originalsourceid>FETCH-LOGICAL-c290t-9ccd3cfdb275466e73b660e242af7ff1c3489ddb8f55034bfa8de9e2406f9ea03</originalsourceid><addsrcrecordid>eNo9kEtLxDAUhYMoOI7uBTfFfcc8mrZZiQy-YHxAqy5Dmt5otE2GJi7m35thBleXw_3OWXwInRO8IASLq_a5WVBM6IJSQitKD9CMcF7nhFf1IZphTOpcFEIco5MQvlMsOOYzdP363mZLP67BBRWtd5nxU_Zhhx_rQkqNdZ8D5M3g15A9gQq_E4zgYtZsQoQxnKIjo4YAZ_s7R293t-3yIV-93D8ub1a5pgLHXGjdM236jla8KEuoWFeWGGhBlamMIZoVtej7rjacY1Z0RtU9iPTHpRGgMJujy92uD9HKoG0E_aW9c6CjJLgSDG8hvIP05EOYwMj1ZEc1bRIht5ZksiS3luTeUqpc7CoWAP7xkqXFNPgHh1BjbQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>PVT Compensation for Wilkinson Single-Slope Measurement Systems</title><source>IEEE Electronic Library (IEL) Journals</source><creator>Tham, K. V. ; Ulaganathan, C. ; Nambiar, N. ; Greenwell, R. L. ; Britton, C. L. ; Ericson, M. N. ; Holleman, J. ; Blalock, B. J.</creator><creatorcontrib>Tham, K. V. ; Ulaganathan, C. ; Nambiar, N. ; Greenwell, R. L. ; Britton, C. L. ; Ericson, M. N. ; Holleman, J. ; Blalock, B. J. ; Brookhaven National Laboratory (BNL)</creatorcontrib><description>A pulse-width locked loop (PWLL) circuit is reported that compensates for process, voltage, and temperature (PVT) variations of a linear ramp generator within a 12-bit multi-channel Wilkinson (single-slope integrating) Analog-to-Digital converter (ADC). This PWLL was designed and fabricated in a 0.5- μm Silicon Germanium (SiGe) BiCMOS process. Simulation and silicon measurement data are shown that demonstrate a large improvement in the accuracy of the PVT-compensated ADC over the uncompensated ADC.</description><identifier>ISSN: 0018-9499</identifier><identifier>EISSN: 1558-1578</identifier><identifier>DOI: 10.1109/TNS.2012.2212722</identifier><identifier>CODEN: IETNAE</identifier><language>eng</language><publisher>United States: IEEE</publisher><subject>46 ; Accuracy ; Analog-to-digital converter (ADC) ; and temperature (PVT) compensation ; Capacitors ; Charge pumps ; Detectors ; Generators ; linear system ; process ; Pulse width modulation ; pulse-width modulator (PWM) ; PWLL ; single-slope measurement systems ; Temperature measurement ; voltage</subject><ispartof>IEEE transactions on nuclear science, 2012-10, Vol.59 (5), p.2444-2450</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c290t-9ccd3cfdb275466e73b660e242af7ff1c3489ddb8f55034bfa8de9e2406f9ea03</citedby><cites>FETCH-LOGICAL-c290t-9ccd3cfdb275466e73b660e242af7ff1c3489ddb8f55034bfa8de9e2406f9ea03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/6307900$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>230,315,786,790,891,27957,27958,55147</link.rule.ids><backlink>$$Uhttps://www.osti.gov/biblio/1079300$$D View this record in Osti.gov$$Hfree_for_read</backlink></links><search><creatorcontrib>Tham, K. V.</creatorcontrib><creatorcontrib>Ulaganathan, C.</creatorcontrib><creatorcontrib>Nambiar, N.</creatorcontrib><creatorcontrib>Greenwell, R. L.</creatorcontrib><creatorcontrib>Britton, C. L.</creatorcontrib><creatorcontrib>Ericson, M. N.</creatorcontrib><creatorcontrib>Holleman, J.</creatorcontrib><creatorcontrib>Blalock, B. J.</creatorcontrib><creatorcontrib>Brookhaven National Laboratory (BNL)</creatorcontrib><title>PVT Compensation for Wilkinson Single-Slope Measurement Systems</title><title>IEEE transactions on nuclear science</title><addtitle>TNS</addtitle><description>A pulse-width locked loop (PWLL) circuit is reported that compensates for process, voltage, and temperature (PVT) variations of a linear ramp generator within a 12-bit multi-channel Wilkinson (single-slope integrating) Analog-to-Digital converter (ADC). This PWLL was designed and fabricated in a 0.5- μm Silicon Germanium (SiGe) BiCMOS process. Simulation and silicon measurement data are shown that demonstrate a large improvement in the accuracy of the PVT-compensated ADC over the uncompensated ADC.</description><subject>46</subject><subject>Accuracy</subject><subject>Analog-to-digital converter (ADC)</subject><subject>and temperature (PVT) compensation</subject><subject>Capacitors</subject><subject>Charge pumps</subject><subject>Detectors</subject><subject>Generators</subject><subject>linear system</subject><subject>process</subject><subject>Pulse width modulation</subject><subject>pulse-width modulator (PWM)</subject><subject>PWLL</subject><subject>single-slope measurement systems</subject><subject>Temperature measurement</subject><subject>voltage</subject><issn>0018-9499</issn><issn>1558-1578</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2012</creationdate><recordtype>article</recordtype><recordid>eNo9kEtLxDAUhYMoOI7uBTfFfcc8mrZZiQy-YHxAqy5Dmt5otE2GJi7m35thBleXw_3OWXwInRO8IASLq_a5WVBM6IJSQitKD9CMcF7nhFf1IZphTOpcFEIco5MQvlMsOOYzdP363mZLP67BBRWtd5nxU_Zhhx_rQkqNdZ8D5M3g15A9gQq_E4zgYtZsQoQxnKIjo4YAZ_s7R293t-3yIV-93D8ub1a5pgLHXGjdM236jla8KEuoWFeWGGhBlamMIZoVtej7rjacY1Z0RtU9iPTHpRGgMJujy92uD9HKoG0E_aW9c6CjJLgSDG8hvIP05EOYwMj1ZEc1bRIht5ZksiS3luTeUqpc7CoWAP7xkqXFNPgHh1BjbQ</recordid><startdate>20121001</startdate><enddate>20121001</enddate><creator>Tham, K. V.</creator><creator>Ulaganathan, C.</creator><creator>Nambiar, N.</creator><creator>Greenwell, R. L.</creator><creator>Britton, C. L.</creator><creator>Ericson, M. N.</creator><creator>Holleman, J.</creator><creator>Blalock, B. J.</creator><general>IEEE</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>OTOTI</scope></search><sort><creationdate>20121001</creationdate><title>PVT Compensation for Wilkinson Single-Slope Measurement Systems</title><author>Tham, K. V. ; Ulaganathan, C. ; Nambiar, N. ; Greenwell, R. L. ; Britton, C. L. ; Ericson, M. N. ; Holleman, J. ; Blalock, B. J.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c290t-9ccd3cfdb275466e73b660e242af7ff1c3489ddb8f55034bfa8de9e2406f9ea03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2012</creationdate><topic>46</topic><topic>Accuracy</topic><topic>Analog-to-digital converter (ADC)</topic><topic>and temperature (PVT) compensation</topic><topic>Capacitors</topic><topic>Charge pumps</topic><topic>Detectors</topic><topic>Generators</topic><topic>linear system</topic><topic>process</topic><topic>Pulse width modulation</topic><topic>pulse-width modulator (PWM)</topic><topic>PWLL</topic><topic>single-slope measurement systems</topic><topic>Temperature measurement</topic><topic>voltage</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Tham, K. V.</creatorcontrib><creatorcontrib>Ulaganathan, C.</creatorcontrib><creatorcontrib>Nambiar, N.</creatorcontrib><creatorcontrib>Greenwell, R. L.</creatorcontrib><creatorcontrib>Britton, C. L.</creatorcontrib><creatorcontrib>Ericson, M. N.</creatorcontrib><creatorcontrib>Holleman, J.</creatorcontrib><creatorcontrib>Blalock, B. J.</creatorcontrib><creatorcontrib>Brookhaven National Laboratory (BNL)</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998–Present</collection><collection>IEEE Xplore</collection><collection>CrossRef</collection><collection>OSTI.GOV</collection><jtitle>IEEE transactions on nuclear science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Tham, K. V.</au><au>Ulaganathan, C.</au><au>Nambiar, N.</au><au>Greenwell, R. L.</au><au>Britton, C. L.</au><au>Ericson, M. N.</au><au>Holleman, J.</au><au>Blalock, B. J.</au><aucorp>Brookhaven National Laboratory (BNL)</aucorp><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>PVT Compensation for Wilkinson Single-Slope Measurement Systems</atitle><jtitle>IEEE transactions on nuclear science</jtitle><stitle>TNS</stitle><date>2012-10-01</date><risdate>2012</risdate><volume>59</volume><issue>5</issue><spage>2444</spage><epage>2450</epage><pages>2444-2450</pages><issn>0018-9499</issn><eissn>1558-1578</eissn><coden>IETNAE</coden><notes>DE-AC02-98CH10886</notes><notes>USDOE SC OFFICE OF SCIENCE (SC)</notes><notes>BNL-98932-2012-JA</notes><abstract>A pulse-width locked loop (PWLL) circuit is reported that compensates for process, voltage, and temperature (PVT) variations of a linear ramp generator within a 12-bit multi-channel Wilkinson (single-slope integrating) Analog-to-Digital converter (ADC). This PWLL was designed and fabricated in a 0.5- μm Silicon Germanium (SiGe) BiCMOS process. Simulation and silicon measurement data are shown that demonstrate a large improvement in the accuracy of the PVT-compensated ADC over the uncompensated ADC.</abstract><cop>United States</cop><pub>IEEE</pub><doi>10.1109/TNS.2012.2212722</doi><tpages>7</tpages></addata></record>
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ispartof IEEE transactions on nuclear science, 2012-10, Vol.59 (5), p.2444-2450
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1558-1578
language eng
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source IEEE Electronic Library (IEL) Journals
subjects 46
Accuracy
Analog-to-digital converter (ADC)
and temperature (PVT) compensation
Capacitors
Charge pumps
Detectors
Generators
linear system
process
Pulse width modulation
pulse-width modulator (PWM)
PWLL
single-slope measurement systems
Temperature measurement
voltage
title PVT Compensation for Wilkinson Single-Slope Measurement Systems
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-09-21T22%3A49%3A21IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_osti_&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=PVT%20Compensation%20for%20Wilkinson%20Single-Slope%20Measurement%20Systems&rft.jtitle=IEEE%20transactions%20on%20nuclear%20science&rft.au=Tham,%20K.%20V.&rft.aucorp=Brookhaven%20National%20Laboratory%20(BNL)&rft.date=2012-10-01&rft.volume=59&rft.issue=5&rft.spage=2444&rft.epage=2450&rft.pages=2444-2450&rft.issn=0018-9499&rft.eissn=1558-1578&rft.coden=IETNAE&rft_id=info:doi/10.1109/TNS.2012.2212722&rft_dat=%3Ccrossref_osti_%3E10_1109_TNS_2012_2212722%3C/crossref_osti_%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c290t-9ccd3cfdb275466e73b660e242af7ff1c3489ddb8f55034bfa8de9e2406f9ea03%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=6307900&rfr_iscdi=true