Direct Sub-Angstrom Imaging of a Crystal Lattice

Despite the use of electrons with wavelengths of just a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns in a crystalline lattice can therefore only be imaged for a fe...

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Bibliographic Details
Published in:Science (American Association for the Advancement of Science) 2004-09, Vol.305 (5691), p.1741-1741
Main Authors: Nellist, P. D., Chisholm, M. F., Dellby, N., Krivanek, O. L., Murfitt, M. F., Szilagyi, Z. S., Lupini, A. R., Borisevich, A., Sides, W. H., Pennycook, S. J.
Format: Article
Language:English
Subjects:
Atoms
Brevia
CRYSTAL LATTICES
Data imaging
Document imaging
ELECTRON MICROSCOPES
Electron, positron and ion microscopes, electron diffractometers and related techniques
Electrons
Exact sciences and technology
Fourier transformations
GEOMETRICAL ABERRATIONS
Image filters
Image resolution
Images of transformations
Imaging
Imaging systems
Information Transfer
Innovations
INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Laboratory Equipment
Materials
Observations
Physics
Profiles
Research and Development
SCANNING ELECTRON MICROSCOPY
Scientific imaging
SPATIAL RESOLUTION
Structure
Transmission electron microscopes
TRANSMISSION ELECTRON MICROSCOPY
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Description
Summary:Despite the use of electrons with wavelengths of just a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns in a crystalline lattice can therefore only be imaged for a few low-order orientations, limiting the range of defects that can be imaged at atomic resolution. The recent development of spherical aberration correctors for transmission electron microscopy allows this limit to be overcome. We present direct images from an aberration-corrected scanning TEM that resolve a lattice in which the atomic columns are separated by less than 0.1 nanometer.
ISSN:0036-8075
1095-9203
DOI:10.1126/science.1100965