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Composition, Roughness, and Topography from Radar Backscatter at Selk Crater, the Dragonfly Landing Site
Abstract The Selk crater region is the future landing site of NASA’s Dragonfly mission to Titan. The region was imaged by the Cassini RADAR at incidence angles from 5° to 72° and at various polarization angles. Using this data set, we mapped six terrain units and assembled a backscatter curve for ea...
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Published in: | The planetary science journal 2022-08, Vol.3 (8), p.201 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Abstract
The Selk crater region is the future landing site of NASA’s Dragonfly mission to Titan. The region was imaged by the Cassini RADAR at incidence angles from 5° to 72° and at various polarization angles. Using this data set, we mapped six terrain units and assembled a backscatter curve for each, providing normalized backscatter cross section (
σ
0
) as a function of incidence angle. By fitting these backscatter curves with a sum of a quasi-specular and diffuse terms and evaluating three alternative formulations of the first and two for the second, we extracted the best-fit surface effective dielectric constant, rms slope, and scattering albedo. Although the parameters’ absolute values are model dependent, relative values between terrains indicate real variations in surface properties. The results are consistent with the impact exposing and fracturing a low-loss tangent material such as the water-ice bedrock, which is likely also present in the hummocky terrains and to a lesser degree in the plains and interdune regions. The dunes and dark terrains are composed of smooth, uniform material with low dielectric constant (1.5–2.3 median values for all models) compatible with organic sand. A diffuse single-scattering model enabled independent derivation of the dielectric constant from high-incidence observations, leading to low values ( |
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ISSN: | 2632-3338 2632-3338 |
DOI: | 10.3847/PSJ/ac8428 |