Predominant reaction products and dielectric breakdown properties of gas mixtures consisting of SF6 and ablation products of C2F4/BN in the temperature range of 300-3000 K

For a high voltage SF6 circuit breaker equipped with a boron nitride (BN)-filled polytetrafluoroethylene ((C2F4) n) nozzle, the predominant reaction products in a high-temperature SF6 mixture with vapor decomposition of C2F4 and BN at temperatures of 300-3000 K are determined based on calculations o...

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Bibliographic Details
Published in:Journal of physics. D, Applied physics Applied physics, 2021-04, Vol.54 (16)
Main Authors: Yokomizu, Y, Terada, M, Kodama, N, Ishii, T, Kojima, Y, Kuroda, M, Urai, H
Format: Article
Language:English
Subjects:
circuit breaker
critical reduced electric field strength
dielectric breakdown property
PTFE/BN composites
reaction product
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Summary:For a high voltage SF6 circuit breaker equipped with a boron nitride (BN)-filled polytetrafluoroethylene ((C2F4) n) nozzle, the predominant reaction products in a high-temperature SF6 mixture with vapor decomposition of C2F4 and BN at temperatures of 300-3000 K are determined based on calculations of equilibrium composition. The calculation is performed by considering the molecular products obtained by chemical reactions with boron atoms (e.g. BN, BS, BC, BF, BF2 and BF3), nitrogen atoms (e.g. N2, N3, CN, NS, NF, NF2 and NF3) and carbon atoms (e.g. CS, CS2, C2F4, CF2, CF3 and CF4). The results obtained for the C2F4-BN molar fraction XCFBN of 20%-80% reveal that BF3, N2 and CF4, the molecules originating from the nozzle material, are produced at high molar fractions over a range of 300-3000 K. Such an evaluation of the gas composition allows the derivation of a reduced collision ionization coefficient α/N and a reduced electron attachment coefficient η/N of the gas, considering various electron impact processes such as BF3 + e → BF2 + F− and CF4 + e → CF3 + F−. The evaluation subsequently enables us to determine a critical reduced electric field strength Ecr/N causing (α−η)/N=0. The results suggest that the decomposed C2F4-BN mixture at XCFBN of 80% causes the reduction of Ecr/N to 110 Td in the range of 1000-2000 K at a gas pressure of 1.0 MPa. This strength Ecr/N is 20 Td lower than that determined separately for the SF6 gas mixture with only 80% C2F4 vapor decomposition, because of the CF4 molar fraction reduction in the SF6/C2F4-BN mixture.
ISSN:0022-3727
1361-6463
DOI:10.1088/1361-6463/abda80