Integrated Coherent Tunable Laser (ICTL) With Ultra-Wideband Wavelength Tuning and Sub-100 Hz Lorentzian Linewidth

This paper describes the design, fabrication, and record performance of a new class of ultra-wideband wavelength tuning, ultra-low noise semiconductor laser, the Integrated Coherent Tunable Laser (ICTL). The ICTL device is designed for, and fabricated in, a CMOS foundry based Silicon Photonics platf...

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Bibliographic Details
Published in:Journal of lightwave technology 2022-03, Vol.40 (6), p.1802-1809
Main Authors: Morton, Paul A., Xiang, Chao, Khurgin, Jacob B., Morton, Christopher D., Tran, Minh, Peters, Jon, Guo, Joel, Morton, Michael J., Bowers, John E.
Format: Article
Language:English
Subjects:
Fiber lasers
Fiber optics
Heterogeneous integration
Laser modes
Laser noise
Laser tuning
Lasers
Low cost
Low noise
low relative intensity noise
narrow linewidth
Noise
Noise intensity
Photonics
Power lasers
Reflection
Relative intensity noise
semiconductor laser
Semiconductor lasers
Silicon
silicon photonics
Tunable lasers
Tuning
ultra-low noise
ultra-wideband wavelength tuning
Ultrawideband
Waveguide lasers
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Summary:This paper describes the design, fabrication, and record performance of a new class of ultra-wideband wavelength tuning, ultra-low noise semiconductor laser, the Integrated Coherent Tunable Laser (ICTL). The ICTL device is designed for, and fabricated in, a CMOS foundry based Silicon Photonics platform, utilizing heterogeneous integration of III-V material to create the integrated gain section of the laser-enabling high-volume mass-market manufacturing at low cost and with high reliability. The ICTL incorporates three or more ultra-low loss micro-ring resonators, with large ring size, in a Sagnac loop reflector geometry, creating exceptional laser reflector performance, plus an extended laser cavity length that enables highly-coherent output; ultra-low linewidth and phase noise. This paper describes record integrated laser performance; 118 nm wavelength tuning, covering S-, C- and L-bands, with Lorentzian linewidth
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2021.3127155