Investigation of Operating System Influence on Single Event Functional Interrupts Using Fault Injection and Hardware Error Detection in ARM Microcontroller

the paper presents a broad investigation of single event effects in ARM microcontroller (MCU) under heavy ion irradiation. Experimental details are presented: device under the test and test setup. The stages of experiments are described: radiation testing using heavy ion accelerator, laser source ir...

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Bibliographic Details
Main Authors: Loskutov, I. O., Kravchenko, N. D., Marfin, V. A., Nekrasov, P. V., Bobrovsky, D. V., Smolin, A. A., Yanenko, A. V.
Format: Conference Proceeding
Language:English
Subjects:
cross-section
fault injection
hardware detection
Lasers
MCU
microcontroller
Microcontrollers
Operating systems
program injector
Radiation effects
Real-time systems
SEFI
Sensitivity
SEU
Simulation
single event functional interrupt
single event upset
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Summary:the paper presents a broad investigation of single event effects in ARM microcontroller (MCU) under heavy ion irradiation. Experimental details are presented: device under the test and test setup. The stages of experiments are described: radiation testing using heavy ion accelerator, laser source irradiation and single event functional interrupts simulation campaign. The algorithm of operation of the program injector for conducting campaigns on simulating SEFI is presented. The influence of a real-time operating system on cross-section of SEFI was evaluated. SEFI cross-sections obtained with and without the operating system were compared. A method using fault injection in program and data memory and hardware detection of functional interrupts was tested. The results of SEFI simulation and calculation by engineering model were compared with experimental results. The results obtained differ from each other. Possible explanations of the proposed differences and the correction of the model are proposed. Directions for further research are outlined.
ISSN:2380-6516
DOI:10.1109/SIBCON50419.2021.9438916