Sputtering Growth of Low-Damping Yttrium-Iron-Garnet Thin Films
This letter reports the development of low-damping yttrium-iron-garnet (YIG) thin films via sputtering. The films were deposited by sputtering at room temperature first and were then annealed in O 2 at high temperature. It is found that the annealing temperature critically affects the structural pro...
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Published in: | IEEE magnetics letters 2020, Vol.11, p.1-5 |
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Main Authors: | , , , |
Format: | Article |
Language: | eng |
Subjects: | |
Online Access: | Get full text |
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Summary: | This letter reports the development of low-damping yttrium-iron-garnet (YIG) thin films via sputtering. The films were deposited by sputtering at room temperature first and were then annealed in O 2 at high temperature. It is found that the annealing temperature critically affects the structural properties of the YIG films and thereby dictates the static and dynamic properties of the films. A 75 nm thick YIG film annealed at 900 °C shows an rms surface roughness of 0.08 nm, a coercivity of only 14 A/m (or 0.18 Oe), a saturation induction of 0.1778 T (or 1778 G), which is very close to the bulk value, a gyromagnetic ratio of 2.82 x 10 4 MHz/T (or 2.82 MHz/Oe), which almost matches the standard value, and a Gilbert damping constant of α≈5.2 x 10 -5 , which is the lowest among the values reported so far for magnetic films in the nanometer thickness range. Frequency-dependent ferromagnetic resonance measurements with different field orientations confirmed that two-magnon scattering, if present, is very weak, and the measured damping value represents the actual damping of the YIG film. |
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ISSN: | 1949-307X 1949-3088 |