Sputtering Growth of Low-Damping Yttrium-Iron-Garnet Thin Films

This letter reports the development of low-damping yttrium-iron-garnet (YIG) thin films via sputtering. The films were deposited by sputtering at room temperature first and were then annealed in O 2 at high temperature. It is found that the annealing temperature critically affects the structural pro...

Full description

Saved in:
Bibliographic Details
Published in:IEEE magnetics letters 2020, Vol.11, p.1-5
Main Authors: Ding, Jinjun, Liu, Tao, Chang, Houchen, Wu, Mingzhong
Format: Article
Language:eng
Subjects:
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:This letter reports the development of low-damping yttrium-iron-garnet (YIG) thin films via sputtering. The films were deposited by sputtering at room temperature first and were then annealed in O 2 at high temperature. It is found that the annealing temperature critically affects the structural properties of the YIG films and thereby dictates the static and dynamic properties of the films. A 75 nm thick YIG film annealed at 900 °C shows an rms surface roughness of 0.08 nm, a coercivity of only 14 A/m (or 0.18 Oe), a saturation induction of 0.1778 T (or 1778 G), which is very close to the bulk value, a gyromagnetic ratio of 2.82 x 10 4 MHz/T (or 2.82 MHz/Oe), which almost matches the standard value, and a Gilbert damping constant of α≈5.2 x 10 -5 , which is the lowest among the values reported so far for magnetic films in the nanometer thickness range. Frequency-dependent ferromagnetic resonance measurements with different field orientations confirmed that two-magnon scattering, if present, is very weak, and the measured damping value represents the actual damping of the YIG film.
ISSN:1949-307X
1949-3088