Resolution Enhancement in Directly Interfaced System for Inductive Sensors

In this paper, a resolution enhancement method for direct interfacing of inductive sensors, without employing analog-to-digital converter and/or external driver circuit, is presented. In order to achieve better resolution with minimum relative error and current consumption factors, different schemes...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 2019-10, Vol.68 (10), p.4104-4111
Main Authors: Asif, Ali, Ali, Amir, Abdin, Muhammad Zain Ul
Format: Article
Language:English
Subjects:
Analog circuits
Analog to digital conversion
Analog to digital converters
Direct interfacing
Driver circuits
Electric potential
embedded systems
Errors
Inductance
inductive sensor
Inductors
microcontroller (<italic xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">μ C)
Microcontrollers
Pins
Resistance
Sensor systems
Sensors
Switches
Voltage
Voltage measurement
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Summary:In this paper, a resolution enhancement method for direct interfacing of inductive sensors, without employing analog-to-digital converter and/or external driver circuit, is presented. In order to achieve better resolution with minimum relative error and current consumption factors, different schemes are implemented which vary in terms of: 1) step-input voltage provision methodology, i.e., through microcontroller ( \mu \text{C} ) pin or through external supply; 2) number of switches used; and 3) method of voltage detection, i.e., either using capture module or employing built-in comparator only. The maximum achievable resolution limits are explored by reducing the lower reference voltage ( \text{V}_{\mathrm {Ref L}} ) in case of detection through built-in analog comparator and/or reducing the series resistance. The one-point calibration technique is used to determine the accuracy. The experiments are performed at 16-MHz clock frequency in the inductance range of: 1) 10-100 \mu \text{H} and 2) 100-1000 \mu \text{H} . The results show that in the limits of a maximum current sourcing/sinking capacity of a typical \mu \text{C} , i.e., 40 mA, the proposed methodology enhances the resolution to 4~\mu \text{H} with a relative error of 1.2 in the percentage of full-scale span (%FSS). The maximum nonlinearity error in %FSS for inductance range 10-100 \mu \text{H} and 100-1000 \mu \text{H} is 1.1% and
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2018.2884561