A 16Gb 18Gb/S/pin GDDR6 DRAM with per-bit trainable single-ended DFE and PLL-less clocking

Starting at 512Mb 6Gb/s/pin [1], GDDR5's speed and density have been steadily developing for about 10 years; recently achieving 8Gb 9Gb/s/pin [2] with per-pin timing training. Although 8Gb GDDR5X can operate at 12Gb/s [3] by increasing the burst length (BL) from 8 to 16, a degradation in system...

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Bibliographic Details
Main Authors: Young-Ju Kim, Hye-Jung Kwon, Su-Yeon Doo, Yoon-Joo Eom, Young-Sik Kim, Min-Su Ahn, Yong-Hun Kim, Sang-Hoon Jung, Sung-Geun Do, Chang-Yong Lee, Jae-Sung Kim, Dong-Seok Kang, Kyung-Bae Park, Jung-Bum Shin, Jong-Ho Lee, Seung-Hoon Oh, Sang-Yong Lee, Ji-Hak Yu, Ji-Suk Kwon, Ki-Hun Yu, Chul-Hee Jeon, Sang-Sun Kim, Min-Woo Won, Gun-hee Cho, Hyun-Soo Park, Hyung-Kyu Kim, Jeong-Woo Lee, Seung-Hyun Cho, Keon-Woo Park, Jae-Koo Park, Yong-Jae Lee, YongJun Kim, Young-Hun Seo, Beob-Rae Cho, Chang-Ho Shin, Chan-Yong Lee, YoungSeok Lee, Yoon-Gue Song, Sam-Young Bang, YounSik Park, Seouk-Kyu Choi, Byeong-Cheol Kim, Gong-Heum Han, Seung-Jun Bae, Hyuk-Jun Kwon, Jung-Hwan Choi, Young-Soo Sohn, Kwang-Il Park, Seong-Jin Jang
Format: Conference Proceeding
Language:English
Subjects:
Clocks
Delays
Jitter
Phase locked loops
Random access memory
Receivers
Transmitters
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Summary:Starting at 512Mb 6Gb/s/pin [1], GDDR5's speed and density have been steadily developing for about 10 years; recently achieving 8Gb 9Gb/s/pin [2] with per-pin timing training. Although 8Gb GDDR5X can operate at 12Gb/s [3] by increasing the burst length (BL) from 8 to 16, a degradation in system performance at a data granularity of 64B is seen. The I/O specification, using PLL clocking that additionally causes PLL jitter, has not changed much compared with GDDR5. To overcome these issues, GDDR6 introduced a dual channel for a data granularity of 32B with a BL16, per-bit training of l/ REF , and an equalizer with PLL-less clocking. This paper presents a 16Gb 18Gb/s/pin GDDR6 DRAM with a die architecture and high-speed circuit techniques on 1.35V DRAM process.
ISSN:2376-8606
DOI:10.1109/ISSCC.2018.8310255