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Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications

In this work features of measurement, processing and analysis of electrical characteristics of MOSFET's subjected to various kinds of static irradiation (neutron, electron, and y-rays) and temperature in the extended high/low ranges are analyzed. As a result a unified (with account for radiatio...

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Main Authors:	Petrosyants, Konstantin O., Sambursky, Lev M., Kharitonov, Igor A., Ismail-zade, Mamed R.
Format:	Conference Proceeding
Language:	English
Subjects:	automated measurement Electric variables measurement MOSFET MOSFET's Parameter extraction radiation effects Semiconductor device modeling SPICE SPICE-modeling Temperature temperature effects Temperature measurement
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creator	Petrosyants, Konstantin O. Sambursky, Lev M. Kharitonov, Igor A. Ismail-zade, Mamed R.
description	In this work features of measurement, processing and analysis of electrical characteristics of MOSFET's subjected to various kinds of static irradiation (neutron, electron, and y-rays) and temperature in the extended high/low ranges are analyzed. As a result a unified (with account for radiation and temperature) automated measurement, parameters extraction and modeling system is developed, which presents a unified environment for a user. Examples are given of the system usage for estimation of integrated and discrete power MOSFET radiation/temperature hardness and their SPICE model parameters extraction.
doi_str_mv	10.1109/EWDTS.2017.8110055
format	conference_proceeding
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identifier	EISSN: 2472-761X
ispartof	2017 IEEE East-West Design & Test Symposium (EWDTS), 2017, p.1-8
issn	2472-761X
language	eng
recordid	cdi_ieee_primary_8110055
source	IEEE Xplore All Conference Series
subjects	automated measurement Electric variables measurement MOSFET MOSFET's Parameter extraction radiation effects Semiconductor device modeling SPICE SPICE-modeling Temperature temperature effects Temperature measurement
title	Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications
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