Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications

In this work features of measurement, processing and analysis of electrical characteristics of MOSFET's subjected to various kinds of static irradiation (neutron, electron, and y-rays) and temperature in the extended high/low ranges are analyzed. As a result a unified (with account for radiatio...

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Bibliographic Details
Main Authors: Petrosyants, Konstantin O., Sambursky, Lev M., Kharitonov, Igor A., Ismail-zade, Mamed R.
Format: Conference Proceeding
Language:English
Subjects:
automated measurement
Electric variables measurement
MOSFET
MOSFET's
Parameter extraction
radiation effects
Semiconductor device modeling
SPICE
SPICE-modeling
Temperature
temperature effects
Temperature measurement
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Description
Summary:In this work features of measurement, processing and analysis of electrical characteristics of MOSFET's subjected to various kinds of static irradiation (neutron, electron, and y-rays) and temperature in the extended high/low ranges are analyzed. As a result a unified (with account for radiation and temperature) automated measurement, parameters extraction and modeling system is developed, which presents a unified environment for a user. Examples are given of the system usage for estimation of integrated and discrete power MOSFET radiation/temperature hardness and their SPICE model parameters extraction.
ISSN:2472-761X
DOI:10.1109/EWDTS.2017.8110055