Damping constants of Co-Cr-Ta and Co-Cr-Pt thin films

Gilbert's damping constants, α , of Co-Cr-Ta and Co-Cr-Pt thin films are determined by Q-band FMR analysis using single crystal magnetic thin films epitaxialIy grown on MgO(110) substrates. α is calculated from the resonance width of the FMR spectrum. α of Co 77 Cr 19 Ta 4 is found to increase...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on magnetics 1997-09, Vol.33 (5), p.2989-2991
Main Authors: Inaba, Uesaka, Y., Nakamura, A., Futamoto, M., Sugita, Y., Narishige, S.
Format: Article
Language:English
Subjects:
Chromium
Damping
Magnetic analysis
Magnetic films
Magnetic resonance
Substrates
Transistors
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Gilbert's damping constants, α , of Co-Cr-Ta and Co-Cr-Pt thin films are determined by Q-band FMR analysis using single crystal magnetic thin films epitaxialIy grown on MgO(110) substrates. α is calculated from the resonance width of the FMR spectrum. α of Co 77 Cr 19 Ta 4 is found to increase from 0.016 to 0.028 as magnetic layer thickness increases from 25 to 240 nm. α also increases from 0.009 to 0.019 when the Cr concentration in the 60 nm thick Co 96-x Cr x Ta 4 magnetic layer is increased from 8 to 19 at.%. The 25 nm thick Co 81 Cr 15 Pt 4 , film has a 2.5 times larger α value (0.038) than the Co 81 Cr 15 Ta 4 film (α = 0.014) with the same thickness.
ISSN:0018-9464
1941-0069
DOI:10.1109/20.617820