Microstructural studies to probe textured growth of sputtered strontium ferrite thin films

Sputtered strontium ferrite films upon annealing at higher temperatures show different textures depending on the deposition parameters as if these parameters leave their signature which eventually decides the texture. To understand the origin of this phenomena the 'as deposited' sputtered...

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Bibliographic Details
Published in:IEEE transactions on magnetics 1996-09, Vol.32 (5), p.4544-4546
Main Authors: Acharya, B.R., Sundararaman, M., Venkataramani, N., Prasad, S., Shringi, S.N., Krishnan, R.
Format: Article
Language:English
Subjects:
Anisotropic magnetoresistance
Annealing
Ferrite films
Magnetic films
Perpendicular magnetic recording
Probes
Sputtering
Strontium
Substrates
Transmission electron microscopy
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Summary:Sputtered strontium ferrite films upon annealing at higher temperatures show different textures depending on the deposition parameters as if these parameters leave their signature which eventually decides the texture. To understand the origin of this phenomena the 'as deposited' sputtered strontium ferrite films were studied using transmission electron microscopy. The study showed that the 'as deposited' films were made up of microcrystallites which were not detected by X-ray diffraction. The study also hinted some kind of texture in the 'as deposited' films, which might be responsible for the final texture of the films when annealed at higher temperatures.
ISSN:0018-9464
1941-0069
DOI:10.1109/20.539075