Characterization of Electromagnetic Leakages throughout the Connector Shell

The paper deals with methodology to analyze electromagnetic (EM) leakages from connectors shielding due to the presence of apertures and slots. Some experimental and numerical results will be proposed to evaluate the electromagnetic coupling between connector apertures and a PCB trace line in terms...

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Bibliographic Details
Main Authors: Bouri, Y., Kone, L., Razafiarivelo, J., Baudry, D., Baranowski, S., Demoulin, B.
Format: Conference Proceeding
Language:English
Subjects:
Connectors
Online Access:Request full text
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Summary:The paper deals with methodology to analyze electromagnetic (EM) leakages from connectors shielding due to the presence of apertures and slots. Some experimental and numerical results will be proposed to evaluate the electromagnetic coupling between connector apertures and a PCB trace line in terms of current and voltage induced on the line.
DOI:10.1109/SPI.2007.4512224