Er3+ luminescence sensitization by Si-nanoparticles in Al2O3 thin films with a controlled nanoscale dopant distribution

The aim of this work is to study the Er 3+ luminescence sensitization by amorphous Si NPs for a nanostructured media that is not based in silica, but in amorphous aluminium oxide (alpha-Al 2 O 3 ). The high contrast between the refractive index of alpha-Al 2 O 3 (1.65) and the one of the SiO 2 cladd...

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Bibliographic Details
Main Authors: Nunez-Sanchez, S., de Castro, M. Jimenez, Toudert, J., Serna, R., Petford-Long, A., Tanase, M., Kabius, B.
Format: Conference Proceeding
Language:English
Subjects:
Erbium
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Summary:The aim of this work is to study the Er 3+ luminescence sensitization by amorphous Si NPs for a nanostructured media that is not based in silica, but in amorphous aluminium oxide (alpha-Al 2 O 3 ). The high contrast between the refractive index of alpha-Al 2 O 3 (1.65) and the one of the SiO 2 cladding layer leads to a high confinement of the guided light, making possible small and compact device structures.
DOI:10.1109/CLEOE-IQEC.2007.4386180